Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2

Autor:	Tristan de Boer, Jonas Häusler, Philipp Strobel, Teak D. Boyko, Stefan S. Rudel, Wolfgang Schnick, Alexander Moewes
Rok vydání:	2021
Předmět:	General Energy 0103 physical sciences 02 engineering and technology Physical and Theoretical Chemistry 021001 nanoscience & nanotechnology 010306 general physics 0210 nano-technology 01 natural sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	The Journal of Physical Chemistry C. 125:27959-27965
ISSN:	1932-7455 1932-7447
DOI:	10.1021/acs.jpcc.1c08115
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2ea04da3d8d5fc897dec70f2170ace87 https://doi.org/10.1021/acs.jpcc.1c08115 Zobrazit plný text záznamu