Atomic-Resolution Structure Imaging of Misfit Dislocations at Heterovalent II–VI/III–V Interfaces

Autor:	David J. Smith, Xinyu Liu, B. S. McKeon, Jacek K. Furdyna
Rok vydání:	2021
Předmět:	Materials science Condensed matter physics Atomic resolution Materials Chemistry Electrochemistry Structure (category theory) Compound semiconductor Electronic Optical and Magnetic Materials Lattice mismatch
Zdroj:	ACS Applied Electronic Materials. 3:2573-2579
ISSN:	2637-6113
DOI:	10.1021/acsaelm.1c00139
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2e685d69dfd7efb342cb6669444d32e8 https://doi.org/10.1021/acsaelm.1c00139 Zobrazit plný text záznamu