| Autor: |
Li Kuo Wang, Yang Hsien Lee, Sian Yi Yang, Wen Yeong Huang, Yi Wen Kuo, Keh-Moh Lin |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
Advanced Materials Research. :90-93 |
| ISSN: |
1662-8985 |
| DOI: |
10.4028/www.scientific.net/amr.562-564.90 |
| Popis: |
In this study, the quality degradation of multi-crystalline silicon photovoltaic (PV) modules during the aging process was observed by using electroluminescence (EL) technology and IV curve measurements in order to find out the occurring timing of damages on solar cells. The influences of soldering materials and temperatures on the performance of the PV modules were also studied. Experimental data show that, high soldering temperatures which induce high thermal stress can easily lead to the power loss of the PV modules. On PV modules soldered with SnAgPb (SAP) solder, ca. 40% of module damages occurred after 25 cycles during the thermal cycling (TC) test. In contrast, there were 61.5% of damaged SnPb (SP) modules after the 25 TC. Most module damages which are attributed to the crack growth and the floating solder emerged during the soldering and encapsulation processes. In our experiment, the average power degradation of all modules was less than 10%. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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