Manufacturing Variation Estimation of On Resistance in Power Semiconductors

Autor:	G. Nicolae, A. Buzo, H. Cucu, C. Burileanu, G. Pelz
Rok vydání:	2022
Zdroj:	2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
DOI:	10.1109/smacd55068.2022.9816218
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2e23d782f72dedf7f1874cb566ad9b55 https://doi.org/10.1109/smacd55068.2022.9816218 Zobrazit plný text záznamu