Optical Characterization of β-FeSi 2 Thin Films Prepared by Femtosecond Laser Ablation
| Autor: | Duan Xiao-feng, Long Hua, LU Pei-Xiang, Zheng Qi-Guang, Zhou You-Hua, Zhang Zhi-Hua, Gao Yi-Hua, Yang Guang |
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| Rok vydání: | 2007 |
| Předmět: |
Fused quartz
Materials science business.industry Scanning electron microscope Polymer characterization General Physics and Astronomy law.invention Optics law Femtosecond Energy filtered transmission electron microscopy Optoelectronics Raman microscope Thin film business High-resolution transmission electron microscopy |
| Zdroj: | Chinese Physics Letters. 24:563-566 |
| ISSN: | 1741-3540 0256-307X |
| Popis: | Iron disilicide thin films are prepared on fused quartz using femtosecond laser deposition (FsPLD) with a FeSi2 alloy target. X-ray diffraction results indicate the films are single-phase, orthorhombic, β-FeSi2. Field scanning electron microscopy, high resolution transmission electron microscopy, UV–VIS–NIR spectroscopy and Raman microscope are used to characterize the structure, composition, and optical properties of the β-FeSi2 films. Normal incidence spectral transmittance and reflectance data indicate a minimum, direct energy gap of 0.85 eV. The two most intense lines of Raman scattering peaked at 181.3 cm−1 and 235.6 cm−1 for the film on fused quartz, and at 191.2 cm−1 and 243.8 cm−1 for the film on Si (100), are observed. |
| Databáze: | OpenAIRE |
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