Reference X-Ray Diffraction Powder Patterns of Fifteen Ceramic Phases
Autor: | Yuming Zhang, Boris Paretzkin, Katherine L. Davis, James M. Stewart, Camden R. Hubbard, Alan L. Dragoo, Winnie Wong-Ng, Howard F. McMurdie |
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Rok vydání: | 1987 |
Předmět: |
Radiation
Materials science Reference data (financial markets) Analytical chemistry chemistry.chemical_element Mineralogy Tungsten Condensed Matter Physics chemistry.chemical_compound chemistry Boride visual_art Telluride X-ray crystallography visual_art.visual_art_medium General Materials Science Ceramic Instrumentation Powder diffraction Diffractometer |
Zdroj: | Powder Diffraction. 2:257-265 |
ISSN: | 1945-7413 0885-7156 |
DOI: | 10.1017/s0885715600012926 |
Popis: | Fifteen reference patterns of boride, silicide, selenide, telluride and oxide ceramics are reported. Included in the 15 reference patterns are data for three oxide phases which are related to high critical temperature (Tc) superconducting materials: BaCuO2, BaCuSm2O5and BaCuYb2O5. Four other patterns are included which represent phases previously not contained in the PDF. The remaining six are major corrections of data already included in the file. Reference data for phases Ba2CuY3O6.8and Ba2Y3CuO6appeared in the special July superconductor issue of theAdvanced Ceramic Materials, 1987. The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1(1), 40 (1986).Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program. |
Databáze: | OpenAIRE |
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