| Autor: |
J. Demarest, B. Austin, J. Arjavac, M. Breton, M. Bergendahl, M. Biedrzycki, C. Boye, J. Gaudiello, J. Hager, S. Matham, K. Nguyen, M. Persala, S. Teehan |
| Rok vydání: |
2018 |
| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| DOI: |
10.31399/asm.cp.istfa2018p0238 |
| Popis: |
Transmission electron microscopy (TEM) sample can be routinely made at a sub 30nm thickness and specific features in semiconductor device design are on the order of 30nm and smaller. As a result, small changes in pattern match registration can significantly influence the success or failure of proper TEM sample placement as an approximately 15nm shift in lamella placement can easily cause the sample to be off the feature of interest. To address this issue, design based recipe writing is being developed on a dual beam focused ion beam platform. The intent is to have the tool read a GDS file and pattern match the design information to physical wafer images in a similar fashion to state-of-the-art critical dimension scanning electron microscopy operation. While the results are very encouraging, more work needs to be done to ensure a TEM sample of approximately 30nm thickness is placed at the desired location. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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