Estimation of Accuracy Level for Sentiment Analysis using Machine Learning and Deep Learning Models

Autor: V. Vanthana, K. Kartheeban
Rok vydání: 2022
Zdroj: 2022 International Conference on Automation, Computing and Renewable Systems (ICACRS).
DOI: 10.1109/icacrs55517.2022.10029086
Databáze: OpenAIRE