Autor:	Alan J. Weger, Philip Tung Wu, Pia Naoko Sanda, Steve Wilson, Moyra K. McManus, Mujahid Muhammad, Franco Stellari, Peilin Song, Robert J. Gauthier, Kiran V. Chatty
Rok vydání:	2003
Předmět:	Materials science business.industry Microscopy Optoelectronics Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics business Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 43:1603-1608
ISSN:	0026-2714
DOI:	10.1016/s0026-2714(03)00281-6
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2c80196e7276b5e706843a6679f09dc4 https://doi.org/10.1016/s0026-2714(03)00281-6 Zobrazit plný text záznamu Full Text from ScienceDirect