Test Method and Application of High-Temperature Operating Life of Automobile Chips
| Autor: | Qinghao Wen, Ruiqing Zhai, Guotian Ji, Tong Zhu, Zheng Li, Yue Hu |
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| Rok vydání: | 2023 |
| Předmět: | |
| Zdroj: | Journal of Physics: Conference Series. 2447:012003 |
| ISSN: | 1742-6596 1742-6588 |
| DOI: | 10.1088/1742-6596/2447/1/012003 |
| Popis: | The high temperature operating life (HTOL) test is an important item in the reliability test of automobile chips. The goal of the HTOL test is to evaluate the durability of automobile chip products under high-temperature loads. Based on the common-used standards, calculation models, and related research experience of evaluating the reliability of electron devices at home and abroad, this paper focuses on the model of the high-temperature durability test model of automobile chips and analyzes different factors affecting the high-temperature operating life test. The general calculation and analysis model and method of the high-temperature operating life test of automobile chips are presented in this paper, which provides a reference for determining the indicators of the high-temperature operating life test of automobile chips. |
| Databáze: | OpenAIRE |
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