Synthesis of Ge nanocrystals by atom beam sputtering and subsequent rapid thermal annealing
| Autor: | D. C. Agarwal, Anand P. Pathak, G. Sai Saravanan, N. Srinivasa Rao, Pawan K. Kulriya, D.K. Avasthi, N. Sathish, V. Saikiran, G. Devaraju |
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| Rok vydání: | 2010 |
| Předmět: |
Materials science
Annealing (metallurgy) Analytical chemistry General Chemistry Sputter deposition Condensed Matter Physics Rutherford backscattering spectrometry Amorphous solid Condensed Matter::Materials Science symbols.namesake Nanocrystal Quantum dot Sputtering Materials Chemistry symbols Raman spectroscopy |
| Zdroj: | Solid State Communications. 150:2122-2126 |
| ISSN: | 0038-1098 |
| DOI: | 10.1016/j.ssc.2010.09.014 |
| Popis: | Ge nanocrystals embedded in an SiO2 matrix were prepared by the atom beam co-sputtering (ABS) method from a composite target of Ge and SiO2. The as-deposited films were rapid thermally annealed at the temperatures 700 and 800 °C in nitrogen ambience. The structure of the films was evaluated by using X-ray diffraction (XRD) and Raman spectroscopy. XRD results reveal that as-deposited films are amorphous in nature whereas annealed samples show crystalline nature. Raman scattering spectra showed a peak of Ge–Ge vibrational mode shifted downwards to 297 cm−1, presumably caused by quantum confinement of phonons in the Ge nanocrystals. Rutherford backscattering spectrometry has been used to measure the thickness and Ge composition of the composite films. Size variation of Ge nanocrystals with annealing temperature has been discussed. The advantages of ABS over other methods are highlighted. |
| Databáze: | OpenAIRE |
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