Sample Preparation Techniques for Grain Boundary Characterization of Annealed TRISO-Coated Particles
| Autor: | James W. Madden, C. M. Hill, I. J. van Rooyen, Jatuporn Burns, Tammy L. Trowbridge, Mary Lou Dunzik-Gougar |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Nuclear and High Energy Physics Materials science Metallurgy 02 engineering and technology Chemical vapor deposition 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Focused ion beam Characterization (materials science) chemistry.chemical_compound Nuclear Energy and Engineering chemistry 0103 physical sciences Silicon carbide Grain boundary Sample preparation 0210 nano-technology Layer (electronics) |
| Zdroj: | Nuclear Technology. 196:111-120 |
| ISSN: | 1943-7471 0029-5450 |
| Popis: | Crystallographic information about layers of silicon carbide (SiC) deposited by chemical vapor deposition is essential to understanding layer performance, especially when the the layers are in nonp... |
| Databáze: | OpenAIRE |
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