Two-Photon Optical Beam Induced Current for Circuit Level Verification and Validation of a 130 nm Microelectronic Device

Autor:	Jeffrey Simon, Noah Mun, Anthony George, Josh Baur, James Busch, Christian Meadows, Katie Liszewski, Isabel Boona, Kurtis Wickey, Thomas Kent, Adam Kimura, Jamin McCue, Glen David Via, Brian Dupaix
Rok vydání:	2021
Zdroj:	2021 IEEE Physical Assurance and Inspection of Electronics (PAINE).
DOI:	10.1109/paine54418.2021.9707705
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2c216c197a856c93109f216ab320af4a https://doi.org/10.1109/paine54418.2021.9707705 Zobrazit plný text záznamu