Metal contacts to gallium arsenide
Autor: | F.D. Auret, Walter E. Meyer, G. Myburg, W.O. Barnard, S. A. Goodman |
---|---|
Rok vydání: | 1996 |
Předmět: |
Materials science
business.industry Schottky barrier Contact resistance Schottky diode Heterojunction Sputter deposition Condensed Matter Physics Metal–semiconductor junction Electronic Optical and Magnetic Materials Semiconductor Materials Chemistry Optoelectronics Electrical and Electronic Engineering business Ohmic contact |
Zdroj: | Journal of Electronic Materials. 25:1695-1702 |
ISSN: | 1543-186X 0361-5235 |
DOI: | 10.1007/s11664-996-0024-1 |
Popis: | In this paper, some aspects that determine the properties of Schottky and ohmic contacts to GaAs are discussed. For Schottky barrier diodes (SBD), we present results of a comprehensive study involving 41 different metals. We pay special attention to Ru and show that its thermal and chemical stability makes it ideal for use in devices operating above room temperature and for experiments involving annealing. Further, we discuss the effect of different metallization methods on SBD properties and show that methods which use energetic particles, such as electron beam deposition and sputter deposition, often result in inferior SBD properties—the consequence of electrically active defects introduced by the energetic particles at and close to the semiconductor surface. The advantages of using Ru as contact material to GaAs are that it forms high quality, thermally stable Schottky contacts to n-GaAs and thermally stable ohmic contacts with low specific contact resistance to p-GaAs. The versatile applicability of Ru contacts makes them extremely important for future use in devices such as heterojunction bipolar transistors and solid state lasers. |
Databáze: | OpenAIRE |
Externí odkaz: |