Test algorithm for memory cell disturb failures

Autor:	J. Lewandowski, D. Aadsen, J.J. Nagy, L. Fenstermaker, Frank P. Higgins, Ilyoung Kim
Rok vydání:	2002
Předmět:	Stuck-at fault Page fault business.industry Computer science Embedded system Fault coverage Registered memory Semiconductor memory Automatic test pattern generation Memory refresh business Segmentation fault
Zdroj:	Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236).
DOI:	10.1109/mtdt.1998.705946
Popis:	The increasing use of two parted register files (one read port and one write port) has introduced complications in complete, accurate testing. This is especially true when the memories appear as embedded cores in Systems On Chips. In this paper, we describe a new fault effect that has been observed, a basic algorithm for detecting this fault, and enhance a well known classic algorithm for memory testing to detect these faults.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2bebdfc89cef4429d16f9788184571a7 https://doi.org/10.1109/mtdt.1998.705946 Zobrazit plný text záznamu