| Autor: |
V. Murgai, H. Jhans, B. Grier, Mark Croft, C. U. Segre, E. Kemly |
| Rok vydání: |
1988 |
| Předmět: |
|
| Zdroj: |
Solid State Communications. 66:1027-1030 |
| ISSN: |
0038-1098 |
| DOI: |
10.1016/0038-1098(88)90315-8 |
| Popis: |
Temperature dependent x-ray diffraction measurements of Eu(Pd 0.9 Au 0.1 ) 2 Si 2 show two (200) Bragg diffraction peaks in the vicinity of the valence transition temperature determined by magnetic susceptibility measurements. As the temperature is lowered through the transition temperature, there is intensity transfer from one peak to the other, over a 50 K temperature range, indicating a discontinuous change in the lattice parameter a . This is a clear indication that spatially distinct macroscopic regions of the sample undergo a first order transition in contradiction with the recent interpretation of Mossbauer Effect measurements as being due to local environment effects. [1] The smearing of the transition temperature is interpreted as being due to sample inhomogeneities. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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