Current-handling and switching performance of MOS-controlled thyristor (MCT) structures

Autor: Friedhelm Dr. Bauer, H. Hollenbeck, Thomas Stockmeier, Wolfgang Fichtner
Rok vydání: 1991
Předmět:
Zdroj: IEEE Electron Device Letters. 12:297-299
ISSN: 1558-0563
0741-3106
DOI: 10.1109/55.82066
Popis: Experimental results are reported for array-type MCT devices fabricated using a BiMOS process with additional power-specific fabrication steps. Stationary measurements of both the thyristor forward behavior and the intrinsic p-channel MOSFET switch characteristics are an indication of the device quality. Through dynamic testing procedures, the device was analyzed in its transient current handling. The combination of anode current and blocking voltage values is the highest ever reported on MCT devices (2 kV, 5 A, in 2 mu s). >
Databáze: OpenAIRE