New Characterization of TiSi2 Local Wiring Technology and Its Impact on Low Power / High Speed Quarter Micron CMOS

Autor: Hiroshi Onoda, Nobuo Ozawa, Atsushi Ohtomo, Jiro Ida, Makiko Kageyama
Rok vydání: 1995
Předmět:
Zdroj: Extended Abstracts of the 1995 International Conference on Solid State Devices and Materials.
DOI: 10.7567/ssdm.1995.pc-3-7
Databáze: OpenAIRE