Electronic and thermal nonlinear refractive indices of SOI and nano-patterned SOI measured by Z-scan method

Autor:	Valentin I. Vlad, Mario Bertolotti, Eugenio Fazio, Yong Chen, C. Peroz, Adrian Petris, Federico Pettazzi
Rok vydání:	2007
Předmět:	Materials science Silicon photonics Silicon Physics::Instrumentation and Detectors business.industry Physics::Optics Silicon on insulator Nonlinear optics chemistry.chemical_element Laser law.invention Optics chemistry law Z-scan technique Photonics business Refractive index
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.756845
Popis:	We measure electronic and thermal nonlinear refractive indices of periodically nano-patterned and un-patterned siliconon- insulator (SOI) in comparison with that of bulk silicon, using a fast reflection Z-scan setup with a high-repetition-rate fs laser (at 800 nm wavelength), and a new procedure for discrimination between electronic and thermal nonlinearities. The electronic nonlinear response of nano-structured SOI is strongly enhanced in comparison with those of un-patterned SOI and of bulk Si. These results could be important in silicon photonics for optical devices with nonlinearity controlled by periodic nano-structuring.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2bb20a33dd41189aeb76915fb682d85f https://doi.org/10.1117/12.756845 Zobrazit plný text záznamu