| Autor: |
Tang Jun, Yi Guo, Hao-yu Yuan, Xiaodong Wang, Yu-chi Wu, Zhi-tao Peng, Dong Jun, Yan-wen Xia, Li Sun, Zhong-gui Lu, Bin Zhu, Jingqin Su, Zhi-hong Sun, Liu Hua, Na Xie |
| Rok vydání: |
2012 |
| Předmět: |
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| Zdroj: |
Conference on Lasers and Electro-Optics 2012. |
| Popis: |
Based on single-shot spectral interferometry, transient measuring technology of laser wakefield at the SILEX-I: Ti: Sapphire Laser is developed. The wakefield is captured with ∼140 fs resolution over a temporal region of 1 ps. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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