Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids

Autor:	Valeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun-Ho Choy, Sofya Torosyan, Yu Zhu
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Computer Graphics and Computer-Aided Design Software
Zdroj:	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4837-4850
ISSN:	1937-4151 0278-0070
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2ba0c400adef4598b99f0736184dd460 https://doi.org/10.1109/tcad.2021.3134886 Zobrazit plný text záznamu