Interface Characteristics of Thin Film with a-axis/c-axis Oriented YBCO

Autor:	Yuh Shiohara, Akihiro Odagawa, Yoshinori Matsunaga, Youichi Enomoto, Kouichi Uehara
Rok vydání:	1995
Předmět:	Materials science business.industry Bilayer Interface (computing) Optoelectronics Substrate (electronics) Sputter deposition Thin film business Layer (electronics) Pulsed laser deposition
Zdroj:	Advances in Superconductivity VII ISBN: 9784431685371
DOI:	10.1007/978-4-431-68535-7_209
Popis:	A-axis oriented YBa2Cu3Oy films have been grown on c-axis oriented YBa2Cu3Oy films The c-axis oriented bottom layer is deposited on a SrTiO3(100) substrate by a pulsed laser deposition, then the a-axis oriented top layer is deposited by off-axis RF magnetron sputtering after reduction of the bottom layer. From cross sectional TEM images, pyramidal c-axis oriented domains are observed between the a-axis and the c-axis layers. The interface angle between the a-axis layer and the pyramidal c-axis domain is about 45°, and CuO2 planes of the a-axis layer and the pyramidal c-axis domain are connected not at 90° but 92°. Tc=80K and Jc=2×106A/cm2 at 60K were obtained with this bilayer film.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2b90998f44117d4050076ec95195108a https://doi.org/10.1007/978-4-431-68535-7_209 Zobrazit plný text záznamu