The Dose Effect in Secondary Electron Emission
| Autor: | T. Svimonishvili, C. Watts, Prashanth Kumar, Michael S. Gilmore, Edl Schamiloglu |
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| Rok vydání: | 2009 |
| Předmět: |
Nuclear and High Energy Physics
Range (particle radiation) Materials science Physics::Medical Physics Direct current Electron Boron carbide Condensed Matter Physics Titanium nitride Secondary electrons chemistry.chemical_compound chemistry Angle of incidence (optics) Secondary emission Physics::Accelerator Physics Atomic physics |
| Zdroj: | IEEE Transactions on Plasma Science. 37:1537-1551 |
| ISSN: | 1939-9375 0093-3813 |
| DOI: | 10.1109/tps.2009.2022970 |
| Popis: | In this paper, total incident electron dose as an inherent parameter in secondary electron emission is experimentally demonstrated. A completely automated experimental setup allows for measuring of secondary electron yield (SEY) as a function of beam energy, angle of incidence of primary electrons, electron dose, and time. SEY data are presented for copper, plasma-sprayed boron carbide, and titanium nitride samples with principal focus on dose dependence. Experiments were conducted in the low-energy range (5-1000 eV) and direct-current regime. Experimental results have been compared with formulas in literature, and good agreement was observed. Modified empirical formulas incorporating the dose effect have also been proposed. |
| Databáze: | OpenAIRE |
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