X-ray diffraction analysis of cold-worked Cu-Ni-Si and Cu-Ni-Si-Cr alloys by Rietveld method
| Autor: | Hiba Azzeddine, L. Djebala, B. Alili, Djamel Bradai, F. Hadj Larbi, Abdel Yazid Khereddine |
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| Rok vydání: | 2011 |
| Předmět: |
Diffraction
Materials science Metallurgy Alloy Metals and Alloys Recrystallization (metallurgy) chemistry.chemical_element engineering.material Geotechnical Engineering and Engineering Geology Condensed Matter Physics Microstructure Copper Root mean square chemistry X-ray crystallography Materials Chemistry engineering Crystallite |
| Zdroj: | Transactions of Nonferrous Metals Society of China. 21:482-487 |
| ISSN: | 1003-6326 |
| DOI: | 10.1016/s1003-6326(11)60740-1 |
| Popis: | Cold worked and annealed supersaturated Cu-2.65Ni-0.6Si and Cu-2.35Ni-0.6Si-0.6Cr alloys were studied. The microstructural parameters evolution, including crystallite size, root mean square strain and dislocation density was analyzed using Materials Analysis Using Diffraction software (MAUD). The parameters for both alloys have typical values of cold deformed and subsequently annealed copper based alloy. A net change of the crystallite size, root mean square strain and dislocation density values of the alloys aged at 450 °C for 2.5–3 h seems corresponding to the recovery and recrystallization processes. Addition of Cr as quaternary element did not lead to any drastic changes of post deformation or ageing microstructural parameters and hence of recovery-recrystallization kinetics. |
| Databáze: | OpenAIRE |
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