The Fractional-N All Digital Frequency Locked Loop with Robustness for PVT Variation and Its Application for the Microcontroller Unit

Autor:	Shuya Nakano, Ryoichi Miyauchi, Yutaka Fukuchi, Koichi Tanno, Akio Yoshida, Yuichi Sekiya, Yukio Kawamura, Hiroki Tamura, Yuki Kodama
Rok vydání:	2021
Předmět:	Loop (topology) Microcontroller Variation (linguistics) Artificial Intelligence Hardware and Architecture Control theory Computer science Robustness (computer science) Computer Vision and Pattern Recognition Electrical and Electronic Engineering Unit (ring theory) Software
Zdroj:	IEICE Transactions on Information and Systems. :1146-1153
ISSN:	1745-1361 0916-8532
DOI:	10.1587/transinf.2020lop0008
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2b5ae71b6fd0484fb3f9d567913d4867 https://doi.org/10.1587/transinf.2020lop0008 Zobrazit plný text záznamu