New tools for Atomic Force Microscopy
| Autor: | C. B. Prater |
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| Rok vydání: | 1995 |
| Předmět: | |
| Zdroj: | Proceedings, annual meeting, Electron Microscopy Society of America. 53:716-717 |
| ISSN: | 2690-1315 0424-8201 |
| DOI: | 10.1017/s0424820100139950 |
| Popis: | The Atomic Force Microscope (AFM) has been widely used in the physics, chemistry, and materials science communities, and is becoming more common in life sciences research. To better serve the biological community, new instruments have been developed recently that combine AFM and various forms of optical microscopy including EPI-fluorescence, DIC, and confocal microscopy. In addition, new techniques like fluid Tapping Mode™ have been developed to allow gentle, non-destructive imaging of biological samples, including live specimens in physiological conditions. Other new techniques can provide information about sample elasticity or molecular adhesion along with nanometerscale topography measurements.Until recently, most AFMs scanned the sample under a stationary probe using a small piezoelectric scanner. This arrangement placed serious limits on the size and type of sample that could be used as a sample substrate. Now instruments have been developed that scan the AFM probe over a fixed sample that then allows imaging of larger, more convenient sample substrates, including cover slips, slides, and even petri dishes. |
| Databáze: | OpenAIRE |
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