Extrinsic scaling effects on the dielectric response of ferroelectric thin films

Autor:	Jon F. Ihlefeld, Aaron M. Vodnick, Jon Paul Maria, Shefford P. Baker, William J. Borland
Rok vydání:	2008
Předmět:	Permittivity Phase transition chemistry.chemical_compound Materials science Condensed matter physics chemistry Electric field Barium titanate General Physics and Astronomy Relative permittivity Crystallite Ferroelectricity Grain size
Zdroj:	Journal of Applied Physics. 103:074112
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.2903211
Popis:	Scaling effects in polycrystalline ferroelectric thin films were investigated by preparing barium titanate in a manner that maintained constant composition and film thickness while allowing systematically increased grain size and crystalline coherence. The average grain dimensions ranged from 60to110nm, and temperature dependence of permittivity analysis revealed diffuse phase transitions in all cases. Maximum permittivity values ranged from 380 to 2040 for the smallest to largest sizes, respectively. Dielectric hysteresis is evident at room temperature for all materials, indicating stability of the ferroelectric phase. Comparison of permittivity values at high electric fields indicates that the intrinsic dielectric response is identical and microstructural artifacts likely have a minimal influence on film properties across the sample series. Permittivity values, however, are substantially smaller than those reported for bulk material with similar grain dimensions. X-ray line broadening measurements were ...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2b3326dc0c2e4c74e041c3fb04a3878e https://doi.org/10.1063/1.2903211 Zobrazit plný text záznamu