| Autor: |
J. Hjelen, N.C. Krieger Lassen, R.A. Schwarzer, M. Søfferud, Morten Karlsen, T. Breivik |
| Rok vydání: |
2009 |
| Předmět: |
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| Zdroj: |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547 |
| DOI: |
10.1007/978-3-540-85156-1_312 |
| Popis: |
Today’s Electron Backscatter Diffraction (EBSD) systems are based on online pattern acquisition and indexing. The new-developed fast, high-sensitivity CCD camera used in the new EBSD detector has now surpassed the speed of available indexing software. The new EBSD system developed by Jarle Hjelen and co-workers has been installed at the Department of Materials Science and Engineering at NTNU, Norway. To reach very high speeds, Niels Christian Krieger Lassen proposed the idea of streaming the acquired diffraction patterns to a hard drive as a means to overcome the online-indexing bottleneck. This method has shown to have several advantages over current commercially available systems. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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