| Popis: |
The development process of a product can be divided into several stages. In each stage of the development process, the product will experience a “Test Analyze and Fix”(TAAF) procedure, during which, the design defects of the product exposed in the test will be modified by engineers to enable the reliability growth after each stage. Then the product will enter the next development stage. To meet the test requirements of product, various test modes will be adopted during the development process of a product. In this paper, a reliability growth model in a multiple test stages framework is proposed to describe the growth trend of product reliability during the development process, which aims to satisfy the demand of failure censored test mode for binomial system. Finally, a numerical example is used to illustrate the proposed development process. |
