Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
| Autor: | M.C. Maher, S.D. Pinkerton, K.B. Crawford, S.H. Penzin, Steven C. Moss, R. Koga, Stephen LaLumondiere, W.R. Crain |
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| Rok vydání: | 1997 |
| Předmět: |
Physics
Nuclear and High Energy Physics business.industry Electrical engineering Integrated circuit Upset law.invention Linear integrated circuits Nuclear Energy and Engineering law Single event upset Operational amplifier Sensitivity (control systems) Electrical and Electronic Engineering business Electronic circuit |
| Zdroj: | IEEE Transactions on Nuclear Science. 44:2325-2332 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/23.659055 |
| Popis: | The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset mechanism and a method for SEU control have been suggested. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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