Measurements of composition and electronic structure in an operating light-emitting diode using analytical electron microscopy
| Autor: | A. Z. Sikorski, Michel Bosman, Vicki J. Keast, M. Sitarz |
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| Rok vydání: | 2004 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) business.industry Scanning electron microscope Electron energy loss spectroscopy Electronic structure law.invention Optics Transmission electron microscopy law Scanning transmission electron microscopy Optoelectronics Energy filtered transmission electron microscopy business Quantum well Light-emitting diode |
| Zdroj: | Applied Physics Letters. 84:1371-1373 |
| ISSN: | 1077-3118 0003-6951 |
| DOI: | 10.1063/1.1649798 |
| Popis: | Scanning transmission electron microscopy (STEM) is a useful technique for the study of the morphology, composition, and electronic structure of quantum wells. However, most previous studies have been on epitaxially grown structures, before they had been used in devices. In this work we show that, with careful specimen preparation, advanced STEM techniques can be used to study a packaged commercially available light-emitting diode. The composition and morphology of both the quantum wells and the superlattices in this device have been determined and the electronic structure was measured with electron energy-loss spectroscopy. |
| Databáze: | OpenAIRE |
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