Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs
| Autor: | Ji-Young Park, Hayeon Shin, Youngtae Choi, Heejin Kim, Jongwoo Park |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Materials science
010401 analytical chemistry 020206 networking & telecommunications Statistical model 02 engineering and technology 01 natural sciences Luminance 0104 chemical sciences Stress (mechanics) Process variation Reliability (semiconductor) Duty cycle 0202 electrical engineering electronic engineering information engineering Transient (oscillation) Exponential decay Biological system |
| Zdroj: | IRPS |
| DOI: | 10.1109/irps.2018.8353566 |
| Popis: | An important technical challenge associated with using OLEDs is to develop an appropriate statistical modeling and reliability assessment for precise lifetime prediction. We, herein, propose a modified stretched exponential decay (MSED) model for luminescence decay with respect to intrinsic emissive layer, which is dependent initial luminescence behaviors and subsequent degradation in the constant current stress tests. By using the model well fitted to experimental data from accelerated stress tests, we successfully demonstrate that a MSED extracted from statistical modeling enables precise lifetime prediction with respect to process variation and duty factor in real operation conditions. |
| Databáze: | OpenAIRE |
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