Experimental Determination of Numerical–Analytical Model Coefficients of Electrophysical Processes in Silicon Power Devices
Autor: | A. B. Ershov, S. V. Anikuev, Sh. Zh. Gabrielyan, I. K. Sharipov |
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Rok vydání: | 2018 |
Předmět: | |
Zdroj: | Russian Electrical Engineering. 89:417-420 |
ISSN: | 1934-8010 1068-3712 |
DOI: | 10.3103/s1068371218070064 |
Popis: | A method has been presented of experimental determination of numerical–analytical model coefficients describing electrophysical processes in silicon power devices that does not use “transistance” (the effect of on-again modes) to decrease loss of power in a device. It has been demonstrated that experimental determination of the coefficients allows one to dispense with numerical solutions of the fundamental systems of equations of semiconductors and use a low-level model for solution of practical problems related to the maximum permissible current loads of silicon power devices in regimes specified by a customer. |
Databáze: | OpenAIRE |
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