A Method to Isolate Intrinsic HCD and NBTI Contributions Under Self Heating During Varying VG/VD Stress in GAA Nanosheet PFETs

Autor:	Nilotpal Choudhury, Souvik Mahapatra
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 69:3535-3541
ISSN:	1557-9646 0018-9383
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2a73dc816954a4b6353cfd42b6488697 https://doi.org/10.1109/ted.2022.3172055 Zobrazit plný text záznamu