Quantitative auger electron spectroscopy of metal monolayers on metals: Evidence for adsorbate/substrate interface effects
| Autor: | M.-G. Barthès, G.E. Rhead, C. Argile |
|---|---|
| Rok vydání: | 1981 |
| Předmět: |
Auger electron spectroscopy
Materials science Analytical chemistry chemistry.chemical_element Surfaces and Interfaces General Chemistry Substrate (electronics) Condensed Matter Physics Surfaces Coatings and Films Overlayer Auger Metal Crystal chemistry visual_art Monolayer Materials Chemistry visual_art.visual_art_medium Tin |
| Zdroj: | Surface and Interface Analysis. 3:165-172 |
| ISSN: | 0142-2421 |
| DOI: | 10.1002/sia.740030406 |
| Popis: | A critical appraisal is made of quantitative AES data obtained for some 30 metal monolayer on metal systems, and in particular for lead and tin monolayers on four substrate elements that have Auger emissions in the energy range 62–72 eV: Ni, Cu, Al, Au. The general agreement for a particular set of data tends to confirm the values of various monolayer densities from LEED but there are very significant differences between the attenuation (of the emissions close in energy) produced by the same overlayer on the different substrates. The emissivity of the overlayer metal may also depend on the nature of the substrate. It is concluded that several factors may affect the detected Auger emissions, including the influence of the absorbate/substrate interface on electron scattering and in particular on the back-emission into the crystal. As a consequence it appears that quantitative analyses via the use of elemental AES emissivities and attenuation factors may be unreliable. |
| Databáze: | OpenAIRE |
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