Traps and Deferred Charge in CCDs

Autor:	Morley M. Blouke, Fanling H. Yang, Denis L. Heidtmann, James Janesick
Rok vydání:	1988
Předmět:	Engineering Pixel business.industry Electronic engineering Optoelectronics Charge (physics) business Charge transfer efficiency Polysilicon gate Single pixel Characterization (materials science)
Zdroj:	Instrumentation for Ground-Based Optical Astronomy ISBN: 9781461283874
Popis:	Defects which collect charge and then release it into subsequent pixels are the major problem facing CCD users and manufacturers. These defects are categorized loosely into three groups: design, material, and processing induced traps. This paper discusses the current state of the understanding of these single pixel defects in terms of both experimental characterization and theoretical modelling.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2a5b6ccc89d1b91a05e8fdae8509ec04 https://doi.org/10.1007/978-1-4612-3880-5_45 Zobrazit plný text záznamu