Deep silicon grating as high-extinction-ratio polarizing beam splitter
| Autor: | Changhe Zhou, Bo Wang, Jiangjun Zheng, Jijun Feng |
|---|---|
| Rok vydání: | 2009 |
| Předmět: |
Total internal reflection
Materials science Holographic grating Extinction ratio business.industry Grating Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Ultrasonic grating Optics law Blazed grating Optoelectronics Electrical and Electronic Engineering business Diffraction grating Beam splitter |
| Zdroj: | Chinese Optics Letters. 7:325-328 |
| ISSN: | 1671-7694 |
| DOI: | 10.3788/col20090704.0325 |
| Popis: | A deep binary silicon grating as high-extinction-ratio reflective polarizing beam splitter (PBS) at the wavelength of 1550 nm is presented. The design is based on the phenomenon of total internal reflection (TIR) by using the rigorous coupled wave analysis (RCWA). The extinction ratio of the rectangular PBS grating can reach 2.5\times10^5 with the optimum grating period of 397 nm and groove depth of 1.092 \mum. The efficiencies of TM-polarized wave in the 0th order and TE-polarized wave in the -1st order can both reach unity at the Littrow angle. Holographic recording technology and inductively coupled plasma (ICP) etching could be used to fabricate the silicon PBS grating. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|