Impact of experimental conditions for the occurrence of stuck bits in commercial SDRAM

Autor:	J. Guillermin, L. Coic, B. Vandevelde, N. Chatry, M. Poizat
Rok vydání:	2021
Zdroj:	2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
DOI:	10.1109/radecs53308.2021.9954558
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2a2470a02a72d1e591c75f1371af8f29 https://doi.org/10.1109/radecs53308.2021.9954558 Zobrazit plný text záznamu