Deterministic Test Vector Compression / Decompression Using an Embedded Processor

Autor:	Dimitris Nikolos, M. Bellos
Rok vydání:	2005
Předmět:	Computer science business.industry Decompression Software development Test compression Reduction (complexity) Automatic test equipment Test vector Embedded system Dependability business Algorithm Volume (compression) Data compression Test data
Zdroj:	Dependable Computing-EDCC 5 ISBN: 9783540257233 EDCC
DOI:	10.1007/11408901_24
Popis:	Test data compression and on-chip decompression using an embedded processor has already been proposed for test data volume and test time reduction as well as for use of slower testers without decreasing test quality. On the other hand, scan cell reordering methods have been proposed to overcome the problem of high average power dissipation during scan based external testing. In this paper we propose a scan cell ordering based test vector compression method, which reduces test data volume up to 87.3%. The decompression of the test data is based on the use of an embedded processor.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::29efa4c35281f574663af159e68124ea https://doi.org/10.1007/11408901_24 Zobrazit plný text záznamu