Weak-laser-irradiation-enhanced solid-phase crystallization of GeSn-on-insulator at low-temperature (180°C) — Thickness-dependent high substitutional-Sn-concentration

Autor: Masanobu Miyao, Hiroshi Ikenoue, Taizoh Sadoh, Kenta Moto, Takayuki Sugino
Rok vydání: 2017
Předmět:
Zdroj: 2017 17th International Workshop on Junction Technology (IWJT).
DOI: 10.23919/iwjt.2017.7966502
Popis: Low-temperature (≤200°C) formation of GeSn (substitutional Sn concentration: >8%) films on insulator is desired to realize high-speed thin film transistors (TFTs) and high-efficiency optical devices on flexible plastic substrates (softening temperature: ∼200°C). This is because GeSn (substitutional Sn concentration: >8%) has higher carrier mobility than Si and Ge due to the direct-transition energy band structure with smaller effective mass of carriers.
Databáze: OpenAIRE