Refractive index profile in titanium-diffused congruent lithium tantalate optical waveguide
| Autor: | Wing-Han Wong, Edwin Yue-Bun Pun, De-Long Zhang, Chao-Yang Zhang, Xiao-Fei Yang, Zi-Bo Zhang |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Physics::Optics chemistry.chemical_element 02 engineering and technology Substrate (electronics) Refractive index profile 01 natural sciences Waveguide (optics) 010309 optics chemistry.chemical_compound Optics 0103 physical sciences General Materials Science Anisotropy Multi-mode optical fiber business.industry Mechanical Engineering 021001 nanoscience & nanotechnology Condensed Matter Physics chemistry Mechanics of Materials Lithium tantalate 0210 nano-technology business Refractive index Titanium |
| Zdroj: | Materials Letters. 217:181-184 |
| ISSN: | 0167-577X |
| DOI: | 10.1016/j.matlet.2018.01.043 |
| Popis: | Titanium-diffused lithium tantalate (Ti:LT) multimode planar waveguide was produced by in-diffusion of titanium thin-film deposited onto a Z-cut congruent LT substrate. Titanium concentration (CTi) in the titanium-diffused layer was profiled by secondary-ion-mass-spectrometry. Modes guided in the waveguide were characterized by prism coupling technique. Refractive index in the waveguide is profiled on the basis of the measured mode indices, and is related to the CTi profile. The results show that both the refractive index and the CTi profiles obey to a Gaussian function. The profiles of titanium-induced extraordinary and ordinary index changes are almost identical, implying that the index change in the Ti:LT waveguide has a small anisotropy and the confinement to the mode field is polarization-insensitive. The ordinary and extraordinary index changes reveal a similar exponential dependence on the CTi with a power index of ∼0.8. |
| Databáze: | OpenAIRE |
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