An AFM study of the morphology and local mechanical properties of superconducting YBCO thin films
| Autor: | A. Verdyan, M. Kazakevich, J. Azoulay, Eugen Rabkin, Ya.M Soifer |
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| Rok vydání: | 2004 |
| Předmět: |
Materials science
Scanning electron microscope business.industry Energy Engineering and Power Technology Young's modulus Nanoindentation Condensed Matter Physics Microstructure Electronic Optical and Magnetic Materials symbols.namesake Optics visual_art Microscopy visual_art.visual_art_medium symbols Ceramic Electrical and Electronic Engineering Thin film Composite material Deformation (engineering) business |
| Zdroj: | Physica C: Superconductivity. 402:80-87 |
| ISSN: | 0921-4534 |
| Popis: | The morphology of thin superconducting YBCO films deposited on sapphire and on SrTiO 3 was studied with the help of atomic force and scanning electron microscopies. The intrinsic mechanical properties in the flat, particles-free and chemically homogeneous regions of the films were determined with the aid of nanoindenting atomic force microscope. Also the microscopy studies revealed the difference in topography of the films, the nanohardness and Young’s modulus of two films were very close to each other. For the indents shallower than 0.2 of the film thickness the Young’s modulus and hardness of the films on two different substrates converged to the values of 210 and 8.5 GPa, respectively. The possible deformation mechanisms determining the localized deformation of intrinsically brittle ceramic films are discussed. |
| Databáze: | OpenAIRE |
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