ARPES/STM study of the surface terminations and 5f -electron character in URu2Si2

Autor: Q. Q. Hao, Wen Zhang, Yong Liu, Xinchun Lai, Yaobo Huang, Yong-Ju Zhang, Shiyong Tan, Donghua Xie, Xie-Gang Zhu, Haiyan Lu, Qiuyun Chen, Wei Feng
Rok vydání: 2018
Předmět:
Zdroj: Physical Review B. 98
ISSN: 2469-9969
2469-9950
DOI: 10.1103/physrevb.98.115121
Popis: Hidden order in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ has remained a mystery that is now entering its fourth decade. The importance of resolving the nature of the hidden order has stimulated extensive research. Here we present a detailed characterization of different surface terminations in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ by angle-resolved photoemission spectroscopy, in conjunction with scanning tunneling spectroscopy and dynamical mean-field theory calculations that may unveil a piece of this puzzle. The U-terminated surface is characterized by an electronlike band around the $\overline{X}$ point, while a holelike band characterizes the Si-terminated surface. We also investigate the temperature evolution of the electronic structure around the $\overline{X}$ point from 11 up to 70 K, and do not observe any abrupt change of the electronic structure around the coherence temperature (55 K). The $f$ spectral weight gradually weakens upon increasing temperature; still some $f$ spectral weight can be found above this temperature. Our results suggest that surface terminations in ${\mathrm{URu}}_{2}{\mathrm{Si}}_{2}$ are an important issue to be taken into account in future work.
Databáze: OpenAIRE