Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
| Autor: | S. V. Senkevich, A. G. Kanareikin, I. P. Pronin, E. Yu. Kaptelov, D. M. Dolgintsev, V. P. Pronin |
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| Rok vydání: | 2017 |
| Předmět: |
010302 applied physics
Phase boundary Materials science Condensed matter physics 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology Microstructure 01 natural sciences Ferroelectricity Surfaces Coatings and Films Condensed Matter::Materials Science Crystallography Tetragonal crystal system Phase (matter) 0103 physical sciences 0210 nano-technology Electron backscatter diffraction Monoclinic crystal system |
| Zdroj: | Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 11:216-222 |
| ISSN: | 1819-7094 1027-4510 |
| DOI: | 10.1134/s1027451017010323 |
| Popis: | The phase state of lead-zirconate-titanate thin films, obtained by a two-stage technology, at the morphotropic phase boundary is studied by electron backscatter diffraction and by measuring the temperature dependence of their dielectric constant. It is shown that depending on the working-gas pressure and the heat-treatment temperature, the volume ratio of the tetragonal and monoclinic modifications of the ferroelectric phase, which coexist at room temperature, varies. The nature of the observed variations is discussed. |
| Databáze: | OpenAIRE |
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