Control Techniques for Increasing the Scan Speed and Minimizing Image Artifacts in Tapping-Mode Atomic Force Microscopy: Toward Video-Rate Nanoscale Imaging

Autor:	S. O. Reza Moheimani, Matthew W. Fairbairn
Rok vydání:	2013
Předmět:	Materials science Microscope business.industry Mode (statistics) Nanotechnology Sample (graphics) Image (mathematics) law.invention Optics Control and Systems Engineering law Modeling and Simulation Tapping Nanometre Electrical and Electronic Engineering Focus (optics) business Nanoscopic scale
Zdroj:	IEEE Control Systems. 33:46-67
ISSN:	1941-000X 1066-033X
DOI:	10.1109/mcs.2013.2279471
Popis:	The atomic force microscope (AFM) [1] is a mechanical microscope capable of producing three-dimensional images of a wide variety of sample surfaces with nanometer precision in air, vacuum, or liquid environments. This article provides an overview of the AFM and its three main modes of operation, with a focus on the tapping mode of operation. The challenges associated with obtaining high-speed images with a tapping-mode AFM while minimizing image artifacts are outlined and control techniques that have been developed to overcome these challenges are reviewed.
Databáze:	OpenAIRE
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