A 45nm 4Gb 3-Dimensional Double-Stacked Multi-Level NAND Flash Memory with Shared Bitline Structure

Autor: Kitae Park, Myounggon Kang, Yeong-Taek Lee, Han-soo Kim, Hoosung Cho, Youngwook Jeong, Soonwook Hwang, Yong-ll Seo, Jae-Hoon Jang, Won-Seong Lee, Chang-Hyun Kim, Doo-gon Kim, Soon-Moon Jung
Rok vydání: 2008
Předmět:
Zdroj: ISSCC
Popis: Recently, 3-dimensional (3D) memories have regained attention as a potential future memory solution featuring low cost, high density and high performance. We present a 3D double stacked 4Gb MLC NAND flash memory device with shared bitline structure, with a cell size of 0.0021mum2/bit per unit feature area. The device is designed to support 3D stacking and fabricated by S3 and 45nm floating-gate CMOS technologies.
Databáze: OpenAIRE