Phase noise analysis in CMOS differential Armstrong oscillator topology
| Autor: | Ilias Chlis, Domenico Pepe, Domenico Zito |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Engineering
Noise temperature business.industry Applied Mathematics 020208 electrical & electronic engineering Armstrong oscillator 020206 networking & telecommunications Topology (electrical circuits) 02 engineering and technology Topology Computer Science Applications Electronic Optical and Magnetic Materials Phase-locked loop symbols.namesake Noise generator CMOS Phase noise 0202 electrical engineering electronic engineering information engineering Electronic engineering symbols Flicker noise Electrical and Electronic Engineering business |
| Zdroj: | International Journal of Circuit Theory and Applications. 44:1697-1705 |
| ISSN: | 0098-9886 |
| DOI: | 10.1002/cta.2187 |
| Popis: | Summary This paper reports a phase noise analysis in a differential Armstrong oscillator circuit topology in CMOS technology. The analytical expressions of phase noise due to flicker and thermal noise sources are derived and validated by the results obtained through SpectreRF simulations for oscillation frequencies of 1, 10, and 100 GHz. The analysis captures well the phase noise of the oscillator topology and shows the impact of flicker noise contribution as the major effect leading to phase noise degradation in nano-scale CMOS LC oscillators. Copyright © 2016 John Wiley & Sons, Ltd. |
| Databáze: | OpenAIRE |
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