STM studies of Si(5 5 12) 2 × 1 surfaces
| Autor: | Takayuki Suzuki, K. Yagi, Yasumasa Tanishiro, Masashi Iwatsuki, Takashi Sueyoshi, Tomoshige Sato, Hiroki Minoda |
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| Rok vydání: | 1996 |
| Předmět: |
Surface (mathematics)
Materials science Reflection high-energy electron diffraction Silicon Period (periodic table) chemistry.chemical_element Surfaces and Interfaces Condensed Matter Physics Molecular physics Surfaces Coatings and Films law.invention Crystallography chemistry law Phase (matter) Materials Chemistry Surface structure Scanning tunneling microscope Surface reconstruction |
| Zdroj: | Surface Science. :522-526 |
| ISSN: | 0039-6028 |
| DOI: | 10.1016/0039-6028(96)00215-4 |
| Popis: | We carried out STM observations of Si(5 5 12) surfaces. STM images showed that the surface has a long period of about 5 nm along the 〈665〉 direction that coincides with a period of the bulk terminated structure, and a period of about 0.7 nm along the 〈110〉 direction that coincides with a 2-fold period of the bulk terminated structure; the 2 × 1 structure. The long period along the 〈665〉 direction is composed of 7 arrays of bright dots. These bright dots appear at the adatom positions of a surface structure model of the (5 5 12) surface proposed previously from RHEED pattern analysis. The phase shifts of the long period which are equivalent to steps are observed on the surface. A surface structural phase transition found in REM-RHEED studies at about 900°C was also observed. |
| Databáze: | OpenAIRE |
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