Surface Defect Detection of Transparent Parts Based on Improved YOLOv4 Model
Autor: | Jing Wang, Jianhong Li, Siwen Wei |
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Rok vydání: | 2022 |
Zdroj: | 2022 5th International Conference on Machine Learning and Machine Intelligence. |
DOI: | 10.1145/3568199.3568224 |
Databáze: | OpenAIRE |
Externí odkaz: |