Scanning Tunneling Microscopy (STM)
| Autor: | N. John DiNardo |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Materials science
business.industry Scanning tunneling spectroscopy Scanning confocal electron microscopy Spin polarized scanning tunneling microscopy Conductive atomic force microscopy Electrochemical scanning tunneling microscope law.invention Scanning probe microscopy law Optoelectronics Scanning tunneling microscope business Quantum tunnelling |
| Zdroj: | Nanoscale Characterization of Surfaces and Interfaces ISBN: 9783527615957 Nanoscale Characterization of Surfaces and Interfaces |
| DOI: | 10.1002/9783527615957.ch2 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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